Image Stitching

Measurement Arrays

An array of (m × n) images can be stitched at any magnification to create a large field of view at higher resolution.

Stitched image arrays combine adjacent fields of view to provide high-density lateral sampling in surface measurements by MicroXAM, a non-contact three dimensional optical profiler.

For large areas, or where high data density or high slope sensitivity is desired, stitching multiple maps into one larger map is a means to accurately extend the capabilities of the objective. Even relatively large fields of view can be measured with reliability. ADE Phase Shift's white light profiler, MicroXAM, can be used to characterize multiple fields of view, with unrivalled resolution in height and increased lateral detail.

The above image of a U.S. Quarter is a three dimensional hybrid height/solid model plot of a Quarter's surface structure: 22.1 mm wide x 22.1 mm high. The measurement was taken by a tabletop version of the MicroXAM.