Data Storage Metrology Products from KLA-Tencor's ADE Division
Product Highlights:
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MicroXAM Optical profiler for hard
disk laser texture measurement.
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MiniFiz Fizeau interferometer for
flatness and RVA (Runout, Velocity and Analysis) of hard disk
substrates.
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M2
DiskMapper determines the uniformity of magnetic properties
immediately after sputtering of magnetic media.
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X9
Magnetic Properties Analysis System for measuring and characterizing
thin film magnetic head material.
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6360
hard disk thickness measurement system
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6360
CD Stamper Thickness System is a semi-automated gaging platform
and data analysis system for the measurement of compact disc,
DVD, CD-R, or CD-ROM stampers
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SpinCheck
HR test high performance hard disk drive motors, including
synchronous error motion (repeatable run out), asynchronous error
motion (non-repeatable run out) and fly height.
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P-16+ stylus profiler for three dimensional metrology of PTR, air-bearing cavities and stiction
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Alpha-Step IQ stylus profiler for metrology of pole-tip recession, air-bearing cavities and stiction
We can also provide custom instrumentation for your special measurement
needs. Contact ADE, or
fill out the form below.
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Applications for this product
Laser ablation calibration
analysis
Laser texture analysis
Duboff analysis
Bearing surface wear
Thick-film conductor thickness
Micro-machining (MEMS)
Related products
MicroXAM RTS "Roughness Testing Station"
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